发明名称 Method for fabricating high performance metal-insulator-metal capacitor (MIMCAP)
摘要 A method of fabricating a high performance metal-insulator-metal capacitor (MIMCAP) includes providing a first inter-level dielectric (ILD) layer over an isolation region; forming a MIMCAP pattern in the first ILD layer over the isolation region; depositing a conformal conductive liner over the MIMCAP pattern and the first ILD layer; depositing an insulator over the conformal conductive liner; forming a contact pattern through the conformal conductive liner, the insulator and the first inter-level dielectric (ILD) layer; depositing a second conformal conductive liner over the MIMCAP pattern, the contact pattern and the first ILD layer; and depositing a conductive stud over the second conformal conductive liner in the MIMCAP pattern and the contact pattern. The method is applicable to both a conventional bulk semiconductor substrate and a silicon-on-insulator (SOI) substrate.
申请公布号 US2007173029(A1) 申请公布日期 2007.07.26
申请号 US20060340340 申请日期 2006.01.26
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ABADEER WAGDI W.;MANDELMAN JACK A.;RADENS CARL J.;TONTI WILLIAM
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
主权项
地址