SECONDARY ELECTRON SPECTROSCOPY METHOD AND SYSTEM,申请号KR20017014520-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	SECONDARY ELECTRON SPECTROSCOPY METHOD AND SYSTEM
摘要
申请公布号	KR100743306(B1)	申请公布日期	2007.07.26
申请号	KR20017014520	申请日期	2001.11.14
申请人		发明人
分类号	H01J37/252	主分类号	H01J37/252
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Methods and systems for using macro coverage to manage femtocell registrations, so as to avoid signaling overload

Interface to facilitate browsing of items of visual content

Loyalty structured call routing system

Multimedia network transposition

Dimension reduction for codebook search

Determining quality of radio access network transmissions

Proactively retransmitting data packets in a low latency packet data network

Custom routing decisions

System and method for communication failover

Disk drive compensating for cycle slip of disk locked clock when reading mini-wedge

Writing and reading data in tape media

Optical reflecting device

Augmented reality computing with inertial sensors

Remote control including touch-sensing surface

System for providing environmental condition information to vehicles and related methods

Deferring alert of notifications for a particular time

Composite electronic component and board having the same mounted thereon

Flush mount wall plate assembly

Soybean cultivar S130088

Soybean variety XB35AX13