| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve the problem wherein a clamp voltage is fluctuated due to dynamic resistance to generate a bump on a clamped waveform at a clamp circuit using a Zener diode, and a pulse width is shortened or a feedback loop performance becomes unstable at a clamp circuit of a conventional feedback system due to delay for turning off a surge absorption semiconductor device, thereby, to provide a clamp circuit and a test signal generator capable of generating a flat and accurate load dumping surge test voltage with proper repeatability. <P>SOLUTION: An output of a window comparator with a first reference voltage and a second reference voltage inputted thereinto is adopted as a loop performance reference voltage for a feedback loop circuit. A detected voltage of a load dumping surge waveform is feedback controlled into a voltage width range specified by the two reference voltages, and a flat clamped waveform is acquired. Since the loop performance reference voltage is maintained at substantially constant, loop performance becomes stable at wide range of surge voltage and surge absorption current. <P>COPYRIGHT: (C)2007,JPO&INPIT |
