发明名称 CONDUCTIVE CARBON NANOTUBE TIP, SCANNING PROBE MICROSCOPE WITH SAME, AND METHOD FOR MANUFACTURING SAME
摘要 PROBLEM TO BE SOLVED: To provide a conductive carbon nanotube tip, a scanning probe microscope with the same, and a method for manufacturing the same. SOLUTION: The conductive carbon nanotube tip includes: a carbon nanotube being disposed upright on a substrate; and a ruthenium coating layer which coats at least a portion of the surface of the carbon nanotube tip and the substrate. The method for manufacturing the carbon nanotube tip comprises: the step (a) of disposing the carbon nanotube upright on the substrate; and the step (b) of forming the ruthenium coating layer which coats at least a portion of the carbon nanotube tip and the substrate, by using an atomic layer evaporation method. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007187665(A) 申请公布日期 2007.07.26
申请号 JP20070005075 申请日期 2007.01.12
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 SANG-JUN CHOI;RI SHOKEN;BANG SANG-BONG;JO HANSHAKU;LEE CHANG SOO
分类号 B82B1/00;G01Q60/38;G01Q60/40;G01Q60/46;G01Q60/48;G01Q70/00;G01Q70/12 主分类号 B82B1/00
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