发明名称 |
CONDUCTIVE CARBON NANOTUBE TIP, SCANNING PROBE MICROSCOPE WITH SAME, AND METHOD FOR MANUFACTURING SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a conductive carbon nanotube tip, a scanning probe microscope with the same, and a method for manufacturing the same. SOLUTION: The conductive carbon nanotube tip includes: a carbon nanotube being disposed upright on a substrate; and a ruthenium coating layer which coats at least a portion of the surface of the carbon nanotube tip and the substrate. The method for manufacturing the carbon nanotube tip comprises: the step (a) of disposing the carbon nanotube upright on the substrate; and the step (b) of forming the ruthenium coating layer which coats at least a portion of the carbon nanotube tip and the substrate, by using an atomic layer evaporation method. COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007187665(A) |
申请公布日期 |
2007.07.26 |
申请号 |
JP20070005075 |
申请日期 |
2007.01.12 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
SANG-JUN CHOI;RI SHOKEN;BANG SANG-BONG;JO HANSHAKU;LEE CHANG SOO |
分类号 |
B82B1/00;G01Q60/38;G01Q60/40;G01Q60/46;G01Q60/48;G01Q70/00;G01Q70/12 |
主分类号 |
B82B1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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