发明名称 HIGHLY RELIABLE SEMICONDUCTOR DEVICE USING HERMETIC SEALING OF ELECTRODES
摘要 The present invention relates to a high-reliable semiconductor device in which electrodes formed on substrates are prevented from deteriorating by sealing the electrodes with a frame member rather than a sealing material. The frame member in the present invention surrounds electrodes formed on the substrates. The inside of the frame member is vacuous or filled with a gas which does not react with the electrodes such as an inert gas and, thereby, the electrodes are prevented from deteriorating by attacks of oxygen or moisture.
申请公布号 KR100743272(B1) 申请公布日期 2007.07.26
申请号 KR20050080144 申请日期 2005.08.30
申请人 发明人
分类号 H01L21/60 主分类号 H01L21/60
代理机构 代理人
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