发明名称 LASER IRRADIATION APPARATUS, LASER IRRADIATION METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a laser irradiation apparatus and a laser irradiation method capable of performing laser treatment to a semiconductor film appropriately by arranging slits in an optical system using a deflector and an fθlens, and reducing the ratio of a region where a microcrystal is formed as accounting for the entire region where laser beams are applied, and further to provide a semiconductor manufacturing apparatus using such a laser irradiation apparatus and a laser irradiation method. SOLUTION: The fθlens having image-side telecentric characteristics, or the slit for changing a shape according to the incident angle of laser beams are used for an optical system. The slit is arranged between the fθlens and an irradiation surface, and an image in the opening of the slit is projected onto the irradiation surface by a projection lens. With the above configuration, laser beams can be applied uniformly to the entire region in the scanning range of the laser beams. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007189209(A) 申请公布日期 2007.07.26
申请号 JP20060331283 申请日期 2006.12.08
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 TANAKA KOICHIRO;OISHI HIROMASA
分类号 H01L21/268;H01L21/20;H01S3/00 主分类号 H01L21/268
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