发明名称 |
Method and apparatus for repairing a shorted tunnel device |
摘要 |
A method for repairing a shorted tunnel device includes the step of applying a stressing signal to the tunnel device. The stressing signal has an amplitude that is greater than an amplitude of a bias signal applied to the device during normal operation. One or more characteristics of the stressing signal are selected so as to substantially optimize a repair of the device. The amplitude and/or the duration of the stressing signal are preferably selected so as to remove a conductive filament shorting the device via a thermal mechanism (e.g., heating).
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申请公布号 |
US2007171736(A1) |
申请公布日期 |
2007.07.26 |
申请号 |
US20060330493 |
申请日期 |
2006.01.12 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
NOWAK JANUSZ J.;LAMOREY MARK CURTIS H.;LU YU |
分类号 |
G06F11/00;G11C29/00 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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