METHOD FOR DETERMINING THE CORROSIVE EFFECT OF POLYMERIC MATERIAL ON THE DURABILITY OF A SEMICONDUCTOR DEVICE

摘要

The proposed method for determining the corrosive effect of polymeric material on the durability of a semiconductor device consists in applying voltage to the terminals of the device, which is installed in a casing made of the polymeric material, providing thermal treatment of the device at the curetemperature of the material, and determining the effect of the material by the electric potential difference between the terminals of the device after the thermal treatment.