发明名称 |
PAD WIRE STRUCTURE FOR SEMICONDUCTOR DEVICE AND MAKING METHOD THEREOF |
摘要 |
A pad wiring structure of a semiconductor device and a method for forming the same are provided to decrease a space occupied by the pad wiring structure, as well as having a protection function of applying only a voltage of a given range. A first conductive layer(314) is formed in a substrate(312) of a first conductive type. The first conductive layer has the same conductive type as that of the substrate. A second conductive layer(324) is formed on the substrate, and has a second conductive type different from that of the substrate. Metal pad layers(318,328) are formed on the first conductive layer and the second conductive layer. A via is formed between the first conductive layer and the metal pad layer and/or between the second conductive layer and the metal pad layer.
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申请公布号 |
KR20070076867(A) |
申请公布日期 |
2007.07.25 |
申请号 |
KR20060006289 |
申请日期 |
2006.01.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
RYU, JUNG SU;KIM, BYEONG YUN |
分类号 |
H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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