发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DECIVE |
摘要 |
A method for manufacturing a semiconductor device is provided to easily perform a spacer etching process by making a part of a dielectric for a spacer into an etch-vulnerable layer and using an etching removal speed of the etch-vulnerable layer. A semiconductor substrate(10) where a conductive pattern(20) is formed is prepared. A dielectric for a spacer is formed on the entire surface of the substrate including the conductive pattern. An implantation process is performed on the dielectric for a spacer to make the dielectric for a spacer part formed on an upper surface of the conductive pattern and the surface of the substrate into an etch-vulnerable layer. The etch-vulnerable layer is selectively removed to form a spacer(50) on a sidewall of the conductive pattern. The conductive pattern is a gate or a bit line.
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申请公布号 |
KR20070076814(A) |
申请公布日期 |
2007.07.25 |
申请号 |
KR20060006165 |
申请日期 |
2006.01.20 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
SONG, SEOK PYO;SHEEN, DONG SUN;AHN, SANG TAE |
分类号 |
H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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地址 |
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