发明名称 Additive printed mask process and structures produced thereby
摘要 <p>A digital lithographic process first deposits a mask layer comprised of print patterned mask features. The print patterned mask features define gaps into which a target material may be deposited, preferably through a digital lithographic process. The target material is cured or hardened, if necessary, into target features. The mask layer is then selectively removed. The remaining target features may then be used as exposure or etch masks, physical structures such as fluid containment elements, etc. Fine feature widths, narrower the minimum width of the print patterned mask features, may be obtained while realizing the benefits of digital lithography in the manufacturing process.</p>
申请公布号 EP1811331(A2) 申请公布日期 2007.07.25
申请号 EP20070100905 申请日期 2007.01.22
申请人 PALO ALTO RESEARCH CENTER INCORPORATED 发明人 WONG, WILLIAM S.;LIMB, SCOTT J.;CHABINYC, MICHAEL L.;RUSSO, BEVERLY;LUJAN, RENE A.
分类号 G03F1/92;G03F7/00;G02F1/1335 主分类号 G03F1/92
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