发明名称 Method of cleaning a silicon-based semiconductor film-forming apparatus
摘要 <p>Disclosed is a method of manufacturing a semiconductor device, in which a substrate (13) is successively transferred through a first film-forming chamber (4) for forming a semiconductor layer of a first conductivity type, a second film-forming chamber (5) for forming an i-type semiconductor layer, and a third film-forming chamber (6) for forming a semiconductor layer of a second conductivity type, thereby forming successively a semiconductor layer of a first conductivity type, an i-type semiconductor layer, and a semiconductor layer of a second conductivity type on the substrate (13). The method comprises the step of simultaneously transferring the substrates (13) arranged within the first, second and third film-forming chambers (4, 5, 6) and each having a semiconductor layer into adjacent chambers on the downstream side. <IMAGE></p>
申请公布号 EP1079422(B1) 申请公布日期 2007.07.25
申请号 EP20000106258 申请日期 2000.03.22
申请人 KANEKA CORPORATION 发明人 NISHIO, HITOSHI;YAMAGISHI, HIDEO;KONDO, MASATAKA
分类号 H01L21/20;C23C16/46;C23C16/54;H01L21/00;H01L21/205;H01L31/18;H01L31/20 主分类号 H01L21/20
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