发明名称 SYSTEM FOR MONITORING THE QUALITY OF THE PROCESS OF GROWING THERMOELECTRIC CRYSTALS BY THE CZOCHRALSKI GROWTH TECHNIQUE
摘要 The proposed system for monitoring the quality of the process of growing thermoelectric crystals by the Czochralski growth technique contains an optical radiation source, a unit for displaying the crystal, a photodetector, and a computer with a memory unit and a video monitor.
申请公布号 UA25162(U) 申请公布日期 2007.07.25
申请号 UA20070003502 申请日期 2007.03.30
申请人 YURII FEDKOVYCH CHERNIVTSY NATIONAL UNIVERSITY 发明人 ASCHEULOV ANATOLII ANATOLIIOVYCH;HRYTSIUK BOHDAN MYKOLAIOVYCH
分类号 G01R27/00;H01L35/00 主分类号 G01R27/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利