| 摘要 |
A thin film transistor board and an inspecting method thereof are provided to prevent deterioration of defective inspection due to delay of a storage line by forming plural storage inspecting pads connected to both ends of common storage lines. Plural pixel electrodes(12) are formed in each sub-pixel region in which plural gate lines(GL1 to GLm) are across plural data lines(DL1 to DLn). Plural thin film transistors(TFT) are connected to the gate lines, the data lines and the pixel electrode. Plural storage lines(SL1 to SLm) are overlapped over the pixel electrodes. A first common storage line(22A) is commonly connected to one end of the storage line, and a second common storage line(22b) is commonly connected to the other end of the storage line. Plural storage inspection pads(24A to 24D) are connected to both ends of the first and second common storage lines.
|
