| 摘要 |
A calibration circuit of a semiconductor device is provided to improve the calibration speed and precision of an input/output circuit of a semiconductor device by dualizing a calibration step. A connection pad is connected between a first calibration target device(111) and an outer resistor(105). A reference voltage is generated by a reference voltage generating part(131). A first comparator(141) compares the voltage generated in the connection pad with the reference voltage to output their voltage difference, connected to the connection pad and the reference voltage generating part. A first calibration window detecting part receives the output signal of the first comparator and compares the output signal of the first comparator with the predetermined first calibration window. A first calibration control part determines the calibration size of the first calibration target device according to the output signal of the first calibration window detecting part and calibrates the first calibration target device, connected to the first calibration target device and the first calibration window detecting part. The first calibration target device can be a pull-up part including a plurality of PMOS transistors for pulling up the voltage generated in the connection pad.
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