发明名称 |
Lateral calibration device and method |
摘要 |
A calibration device and method for lateral force calibration in small force measuring devices such as atomic force microscopes is disclosed. A platform has a substantially planar surface including a slot for accommodating at least part of the AFM cantilever tip, one or more supporting legs arranged to provide sprung resistance to the platform and a capacitive drive means for driving the platform laterally with respect to the AFM cantilever tip.
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申请公布号 |
US7246513(B2) |
申请公布日期 |
2007.07.24 |
申请号 |
US20050259642 |
申请日期 |
2005.10.25 |
申请人 |
THE SECRETARY OF STATE FOR TRADE AND INDUSTRY OF HER MAJESTY'S BRITANNIC GOVERNMENT |
发明人 |
CUMPSON PETER J. |
分类号 |
G01P21/00;G01Q40/00;G01Q60/24 |
主分类号 |
G01P21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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