APPARATUS FOR CONTACTING DEVICES TO TEST SOCKETS IN SEMICONDUCTOR TEST HANDLER

摘要

A device connecting apparatus of a semiconductor device test handler is provided to change force for pressing a semiconductor device correspondingly to the thickness of the semiconductor device or the number of balls by adjusting only the moving distance of a movable unit, thereby obtaining desirable pressurizing force without modifying or exchanging components. A device connecting apparatus of a semiconductor device test handler is composed of a test head(100) having a test socket(110) connected with a semiconductor element(S); a movable unit(210) movably installed at a predetermined spot of the outside of the test head; a driving unit moving the movable unit to the predetermined spot; a device push member(230) installed at the movable unit to relatively move and selectively connected with the semiconductor device by the movement of the movable unit to contact the semiconductor device to the test socket; and an elastic member for varying the force for pressing the semiconductor device by the device push member, according to the moving distance of the movable unit.