发明名称 APPARATUS FOR CONTACTING DEVICES TO TEST SOCKETS IN SEMICONDUCTOR TEST HANDLER
摘要 A device connecting apparatus of a semiconductor device test handler is provided to connect a semiconductor device to a test socket of a test head with the exact power, by detecting that the test head is combined to a test site and exactly setting the moving distance of a contact push unit according to the combined state of the test head. A device connecting apparatus of a semiconductor device test handler is composed of a test head(100) provided with a test socket(110) connected with a semiconductor device and detachably combined to one surface of a test site; a contact push unit(200) installed at the test site with facing the test head, to contact the semiconductor device to the test socket of the test head by pushing; a push unit driving part moving the contact push unit in the desirable distance; a control unit controlling the operation of the push unit driving part; and a distance measuring unit measuring the relative distance between at least one spot of the contact push unit and the test head.
申请公布号 KR20070075757(A) 申请公布日期 2007.07.24
申请号 KR20060004370 申请日期 2006.01.16
申请人 MIRAE CORPORATION 发明人 HAM, CHUL HO;PARK, CHAN HO
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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