发明名称 |
APPARATUS FOR CONTACTING DEVICES TO TEST SOCKETS IN SEMICONDUCTOR TEST HANDLER |
摘要 |
A device connecting apparatus of a semiconductor device test handler is provided to connect a semiconductor device to a test socket of a test head with the exact power, by detecting that the test head is combined to a test site and exactly setting the moving distance of a contact push unit according to the combined state of the test head. A device connecting apparatus of a semiconductor device test handler is composed of a test head(100) provided with a test socket(110) connected with a semiconductor device and detachably combined to one surface of a test site; a contact push unit(200) installed at the test site with facing the test head, to contact the semiconductor device to the test socket of the test head by pushing; a push unit driving part moving the contact push unit in the desirable distance; a control unit controlling the operation of the push unit driving part; and a distance measuring unit measuring the relative distance between at least one spot of the contact push unit and the test head. |
申请公布号 |
KR20070075757(A) |
申请公布日期 |
2007.07.24 |
申请号 |
KR20060004370 |
申请日期 |
2006.01.16 |
申请人 |
MIRAE CORPORATION |
发明人 |
HAM, CHUL HO;PARK, CHAN HO |
分类号 |
G01R31/26;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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