发明名称 |
Production of monocrystalline material on a dielectric material, comprises forming a partially crystalline first layer, and forming an amorphous/partially crystalline second layer of first material on the partially crystalline first layer |
摘要 |
<p>#CMT# #/CMT# The production of monocrystalline material on a dielectric material (2), comprises forming a partially crystalline first layer (4) having the first material on the portion of the third material surface by remote plasma-enhanced chemical vapor deposition, forming an amorphous/partially crystalline second layer of first material on the partially crystalline first layer of first- and second material located around the opening by plasma enhanced chemical vapor deposition/low energy plasma enhanced chemical vapor deposition, and annealing of recrystallization of the first material. #CMT# : #/CMT# The production of monocrystalline material on a dielectric material (2), comprises forming a partially crystalline first layer (4) having the first material on the portion of the third material surface by remote plasma-enhanced chemical vapor deposition, forming an amorphous/partially crystalline second layer of first material on the partially crystalline first layer of first- and second material located around the opening by plasma enhanced chemical vapor deposition/low energy plasma enhanced chemical vapor deposition, and annealing of recrystallization of the first material. The second material has an opening exposed to a portion of third monocrystalline material surface. The first material has germanium. The third material has silicon. The second material has an oxide or a nitride of third material. The formation of amorphous/partially crystalline second layer comprises chemico-mechanical polishing of the second material surface and/or the first layer of the first material surface. The formation of the partially crystalline first layer comprises forming a layer comprising second material, on a part of the third material moncrystalline surface. The deposition of the dielectric layer encapsulates the second layer of the first material formed at the annealing stage. #CMT#USE : #/CMT# Useful for producing monocrystalline material on a dielectric material. #CMT#ADVANTAGE : #/CMT# The production of monocrystalline material on a dielectric material is simple and cost effective. #CMT#DESCRIPTION OF DRAWINGS : #/CMT# The diagram shows a production of a monocrystalline material on a dielectric material: 2 : Dielectric layer; 4 : Partially crystalline layer.</p> |
申请公布号 |
FR2896338(A1) |
申请公布日期 |
2007.07.20 |
申请号 |
FR20060000414 |
申请日期 |
2006.01.17 |
申请人 |
STMICROELECTRONICS (CROLLES) 2 SAS SOCIETE PAR ACTIONS SIMPLIFIEE |
发明人 |
KERMARREC OLIVIER;CAMPIDELLI YVES;PIN GUILLAUME |
分类号 |
H01L21/20;C30B33/00;H01L21/30;H01L21/762 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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