发明名称 |
Positive resist composition and process for formation of resist patterns |
摘要 |
A positive resist composition includes a resin component (A) and an acid generator component (B), wherein the component (A) is a copolymer that includes a structural unit (a1) derived from an (alpha-lower alkyl)acrylate ester that contains a monocyclic or polycyclic group-containing acid dissociable, dissolution inhibiting group, a structural unit (a2) derived from an (alpha-lower alkyl)acrylate ester that contains a lactone ring, a structural unit (a3) derived from an (alpha-lower alkyl)acrylate ester that contains a polar group-containing polycyclic group, and a structural unit (a4).
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申请公布号 |
US2007166641(A1) |
申请公布日期 |
2007.07.19 |
申请号 |
US20050578230 |
申请日期 |
2005.04.07 |
申请人 |
SHIMIZU HIROAKI;IWAI TAKESHI |
发明人 |
SHIMIZU HIROAKI;IWAI TAKESHI |
分类号 |
G03C1/00;C08F220/10;C08F220/18;C08F220/28;G03F7/033;G03F7/039;H01L21/027 |
主分类号 |
G03C1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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