发明名称 Substrate processing apparatus
摘要 In a substrate processing apparatus for processing a substrate for manufacturing a semiconductor device, a mist passage ( 5 ) is formed to pass through a part of a processing vessel ( 2 ) as an object to be cooled. There are disposed a mist generator ( 64 ) that generates a mist, and a gas supply source ( 62 ) that supplies a carrier gas for carrying the generated mist. A temperature of the part to be cooled is detected by a temperature sensor ( 49 ). When the detected temperature exceeds a predetermined temperature, a water mist, for example, is allowed to flow into the mist passage so as to cool the processing vessel by a heat of evaporation of the mist. Thus, the temperature of the processing vessel can be promptly lowered, and thus a plasma process can be performed under an atmosphere of a stable temperature.
申请公布号 US2007163502(A1) 申请公布日期 2007.07.19
申请号 US20040585408 申请日期 2004.12.24
申请人 NOZAWA TOSHIHISA;MORITA OSAMU;YUASA TAMAKI;KOTANI KOJI 发明人 NOZAWA TOSHIHISA;MORITA OSAMU;YUASA TAMAKI;KOTANI KOJI
分类号 C23C16/00;C23C16/44;B05C11/00;C23C14/00;H01J37/32;H01L21/00;H01L21/205;H01L21/22;H01L21/3065;H01L21/31;H01L21/324 主分类号 C23C16/00
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