发明名称 Method of Fabricating a Lateral Double-Diffused Mosfet
摘要 A method of monolithically fabricating an LDMOS transistor with a fabrication process that is compatible with a sub-micron CMOS fabrication process. The specification further describes an LDMOS transistor. The LDMOS transistor is implemented in a first impurity region on a substrate. The LDMOS transistor has a source that includes a second impurity region. The second impurity region is implanted into the surface of the substrate within the first impurity region. Additionally, the LDMOS transistor has a drain that includes a third impurity region. The third impurity region is implanted into the surface of the substrate within the first impurity region. The third impurity region is spaced a predetermined distance away from a gate of the LDMOS transistor. The drain of the LDMOS transistor further includes a fourth impurity region within the third impurity region. The fourth impurity region provides an ohmic contact for the drain.
申请公布号 US2007166896(A1) 申请公布日期 2007.07.19
申请号 US20070677724 申请日期 2007.02.22
申请人 VOLTERRA SEMICONDUCTOR CORPORATION 发明人 YOU BUDONG;ZUNIGA MARCO A.
分类号 H01L21/84;H01L21/336;H01L21/8238;H01L21/8249;H01L27/06;H01L27/092;H01L29/08;H01L29/732;H01L29/78 主分类号 H01L21/84
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