| 摘要 |
<P>PROBLEM TO BE SOLVED: To previously test characteristic variations in a plurality of differential amplifying circuits being formed on a TFT array substrate for example, before forming a pixel section on the substrate. <P>SOLUTION: Each differential amplifying circuit SAij comes into electric continuity with a first group of signal lines XL1, XL2 at different timings in response to the first group of signal lines XL1, XL2, and a first output signal OPa and a second output signal OPb are read out from respective signal supply lines 213a, 213b for each differential amplifying circuit SAij. Therefore, an output voltage being a potential difference between the first output signal OPa and the second output signal OPb is detected by each differential amplifying circuit SAij, and a judgement is made whether or not the output voltage is amplified in comparison with a test-use voltage, whereby each differential amplifying circuit Sij is judged whether it operates normally. Therefore, it becomes clear indirectly whether or not differences of threshold voltages between TFTs 53, 54 including the differential amplifying circuit vary mutually among the plurality of differential amplifying circuits. <P>COPYRIGHT: (C)2007,JPO&INPIT |
