发明名称 TOUGH SHALLOW TRENCH SEPARATING STRUCTURE AND METHOD FOR FORMING SHALLOW TRENCH SEPARATING STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide a shallow trench separating structure that a dielectric material is located in voids of a material filled in the trench, and a method for forming its shallow trench separating structure concerning a semiconductor substrate. SOLUTION: In the method for forming the shallow trench separating structure 84, those voids are formed in a wet cleaning process after forming the dielectric material 56 in the trench. A conformal silicon nitride layer is formed on the substrate and in the voids. After removing the silicon nitride layer, the voids are at least partially filled with a silicon nitride material. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007184588(A) 申请公布日期 2007.07.19
申请号 JP20060345124 申请日期 2006.12.22
申请人 AGERE SYSTEMS INC 发明人 NANDA ARUN K;ROSSI NACE;RANBIA SING
分类号 H01L21/76;H01L21/318 主分类号 H01L21/76
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