发明名称 CALIBRATION METHOD FOR PROFILING PROBE
摘要 PROBLEM TO BE SOLVED: To provide a calibration method for a profiling probe for performing calibration of the profiling probe accurately in a short time. SOLUTION: A first measuring path 71 and a second measuring path 72 are set as measuring path for performing profiling measurement of the surface of a master ball 7, a sphere whose radius and center coordinate value are known (measuring path setting process). Next, the first measuring path 71 and second measuring path 72 set in the measuring path setting process are profiling measured (measuring process). An output value of a detection sensor of the profiling probe in the measuring process is compared with the coordinate values on the measuring paths 71 and 72, and corrective data for correcting the output value of the detection sensor is calculated (corrective data calculating process). Here, the first measuring path 71 and second measuring path 72 set in the measuring path setting process have a spiral shape on the surface of the master ball 7. Origins 711 and 721 of two measuring paths 71 and 72 are shifted by 90°on the equator. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007183184(A) 申请公布日期 2007.07.19
申请号 JP20060001811 申请日期 2006.01.06
申请人 MITSUTOYO CORP 发明人 NODA TAKASHI
分类号 G01B21/00 主分类号 G01B21/00
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