发明名称 X-RAY INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an X-ray inspection device capable of displaying a specified portion measured in an X-ray image, and a measured result as to the specified portion, for an operator to acquire easily those while correlated each other. SOLUTION: The X-ray inspection device for creating the X-ray image based on a measured object photographed by an X-ray measuring optical system 13, and for conducting local measurement as to the specified portion in the created X-ray image, includes an image data assigning part 34 for assigning the specified portion for measuring locally the X-ray image, a specified portion local measurement part 35 for measuring the assigned specified portion, a measured result character information creation part 36 for creating measured result character information with the measured result of the specified portion expressed by character-or-the-like information such as characters, symbols, patterns, and a measured result character information overwriting part 37 for overwriting the measured result character information on the X-ray image of the corresponding specified portion. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007183103(A) 申请公布日期 2007.07.19
申请号 JP20050380638 申请日期 2005.12.29
申请人 SHIMADZU CORP 发明人 TATEZAWA YOSHIHIRO
分类号 G01N23/04 主分类号 G01N23/04
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