| 摘要 |
Provided is a method of changing an output current value of an off-chip driver by means of a counting circuit including pluralities of fuses for controlling the off-chip driver, that includes measuring the output current value of the off-chip driver after completing a wafer test; cutting the fuses of the counting circuit off when the measured output current value is smaller than a target value, increasing the initial value of a off-chip driving control signal; and fabricating a package when the measured output current value is equal to a target value.
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