发明名称 WAFER LEVEL CHIP SCALE PACKAGE HAVING REROUTING LAYER AND METHOD OF MANUFACTURING THE SAME
摘要 A wafer level chip scale package capable of reducing parasitic capacitances between a rerouting and the metal wiring of a wafer, and a method for manufacturing the same are provided. An embodiment of the wafer level chip scale package includes a wafer arranged with a plurality of bonding pads and an insulating member formed on the wafer so that the bonding pads are exposed. A rerouting is further formed on the insulating member in contact with the exposed bonding pads and an external connecting terminal is electrically connected to a portion of the rerouting. Here, the insulating member overlapping the rerouting is provided with a plurality of spaces in which air is trapped.
申请公布号 US2007164431(A1) 申请公布日期 2007.07.19
申请号 US20060549933 申请日期 2006.10.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE IN YOUNG;CHUNG HYUN-SOO;LEE DONG-HO;SIM SUNG-MIN;SEO DONG-SOO;RYU SEUNG-KWAN;PARK MYEONG-SOON
分类号 H01L23/48;H01L21/44 主分类号 H01L23/48
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