发明名称 METHOD AND DEVICE FOR PRECISELY MEASURING GROUP REFRACTIVE INDEX OF OPTICAL MATERIAL
摘要 PROBLEM TO BE SOLVED: To provide a method for easily and accurately measuring a group refractive index without requiring thickness information of a sample to be measured. SOLUTION: An interferometer is constituted by serially connecting a first interferometer 2 of a Michelson type or the like and a second interferometer 3 of the same type by using a low-coherence light source as its light source. Then, an optical material to be measured 13 whose group refractive index is to be measured, and a first compensating plate 14 made of the same material are disposed on the first interferometer 2, and a second compensating plate 15 is disposed on the second interferometer. A mirror in the interferometer is scanned in the direction of its optical axis, while switching optical paths, and positions where low-coherence interference fringes appear are measured in a plurality of times, and the group refractive index is calculated based on the positions. In another method, the optical material to be measured whose group refractive index is to be measured, and one compensating plate made of the same material are employed to a triangular optical path interferometer. While the optical material to be measured is operated together with one compensating plate in the direction of its optical axis, the positions where the low-coherence interference fringes appear are measured, and the group refractive index is calculated. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007183297(A) 申请公布日期 2007.07.19
申请号 JP20070102208 申请日期 2007.04.09
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 HIRAI AKIKO;MATSUMOTO KOICHI
分类号 G01N21/45 主分类号 G01N21/45
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