ANISOTROPIC CONDUCTIVE CONNECTOR AND PROBE MEMBER AND WAFER INSPECTING DEVICE AND WAFER INSPECTING METHOD,申请号KR20057014684-传众专利搜索

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发明名称	ANISOTROPIC CONDUCTIVE CONNECTOR AND PROBE MEMBER AND WAFER INSPECTING DEVICE AND WAFER INSPECTING METHOD
摘要
申请公布号	KR100741228(B1)	申请公布日期	2007.07.19
申请号	KR20057014684	申请日期	2005.08.10
申请人		发明人
分类号	H01L21/66;G01R1/06;G01R1/073;G01R31/28;H01R11/01	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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