发明名称 Cleaning member for semiconductor apparatus and process for producing the same
摘要 An object is to provide a cleaning member for semiconductor apparatus which can easily remove, without fail, foreign matters adherent to inner parts of a semiconductor apparatus, can bear a clearly readable mark for lot management, and can be prevented from generating particles upon contact with the holding part of a wafer case. A cleaning member for semiconductor apparatus, characterized in that the cleaning member comprises a wafer 1 and formed on at least one side thereof a cleaning layer 2 made of a heat-resistant resin formed by thermally curing a poly(amic acid), and that the cleaning layer 2 has a part 12 where a wafer surface is exposed; and in particular a cleaning member for semiconductor apparatus having the constitution described above wherein that part 12 in the cleaning layer 2 in which a wafer surface is exposed is a part where the cleaning layer has been removed throughout the whole circular area having a given width ranging from the peripheral edge of the wafer toward the center thereof.
申请公布号 US2007163621(A1) 申请公布日期 2007.07.19
申请号 US20050591330 申请日期 2005.03.07
申请人 NITTO DENKO CORPORATION 发明人 ISHIZAKA HITOSHI;UENDA DAISUKE;HANAI DAISUKE
分类号 B08B9/00;B08B7/00;H01L21/00;H01L21/304 主分类号 B08B9/00
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