发明名称 Integration type input circuit and method of testing it
摘要 An input interface circuit is provided which includes an input transistor for receiving a digital input signal, a circuit for generating a reference value, and an integrating capacitor connected in series to a pair of current conducting electrodes of the input transistor for integrating the input signal. A logic level of the input signal is discriminated by comparing an integration of the input signal with the reference value. To provide a testing function, a test transistor is connected to a junction between the pair of current conducting electrodes of the input transistor and the integrating capacitor so that a current driving capability may be determined. Additionally, a discharge path circuit for controllably discharging the integrating capacitor is connected to the junction between the input transistor and the integrating capacitor.
申请公布号 US7246284(B2) 申请公布日期 2007.07.17
申请号 US20040928179 申请日期 2004.08.30
申请人 UNITED MICROELECTRONICS CORPORATION 发明人 TAKAHASHI YASUHIKO
分类号 G01R31/28;G01R31/317;G11C29/56 主分类号 G01R31/28
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