发明名称 Method and device for surface inspection
摘要 A method for surface inspection, comprising the step of projecting at least two laser beams with different wavelengths to a same point to be inspected via a same projecting lens, the step of setting incident angles of the two laser beams so that fluctuations of values of reflectivity of the laser beams are complementary to each other, and the step of detecting reflected scattered light components.
申请公布号 US7245388(B2) 申请公布日期 2007.07.17
申请号 US20030732064 申请日期 2003.12.10
申请人 KABUSHIKI KAISHA TOPCON 发明人 ISOZAKI HISASHI;SATO TAKUJI;ENOMOTO YOSHIYUKI;MAEKAWA HIROYUKI
分类号 G01B11/28;G01B11/30;G01N21/95;G01N21/956;H01L21/66 主分类号 G01B11/28
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