发明名称 Apparatus for generating internal voltage in test mode and its method
摘要 An apparatus for receiving a first supply voltage in order to generate an internal voltage includes a control signal generating block for receiving a control enable signal and a clock signal and generating a pumping control signal having a period determined by one of the control enable signal and the clock signal in response to a test mode signal; and a charge pumping block for converting the first supply voltage into the internal voltage in response to the pumping control signal.
申请公布号 US7245176(B2) 申请公布日期 2007.07.17
申请号 US20040015503 申请日期 2004.12.20
申请人 HYNIX SEMICONDUCTOR INC. 发明人 DO CHANG-HO
分类号 H03K3/01;G05F1/10 主分类号 H03K3/01
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