发明名称 Data read circuit for use in a semiconductor memory and a method therefor
摘要 A data read circuit and method for use in a semiconductor memory device that has a memory cell array are provided. The circuit includes a selector for selecting a unit cell within the memory cell array in response to an address signal; a clamping unit for supplying a clamp voltage having a level for a read operation to a bit line of the selected unit cell in response to a clamp control signal; a precharge unit for precharging a sensing node to a voltage having a power source level in response to a control signal of a first state in a precharge mode, and compensating through the sensing node for a reduced quantity of current at the bit line in response to a control signal of a second state in a data sensing mode; and a sense amplifier unit for comparing a level of the sensing node with a reference level, and for sensing data stored in the selected unit cell.
申请公布号 US7245543(B2) 申请公布日期 2007.07.17
申请号 US20050249858 申请日期 2005.10.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 OH HYUNG-ROK;CHO WOO-YEONG;KWAK CHOONG-KEUN
分类号 G11C7/00;G11C13/00;G11C7/06;G11C7/12;G11C13/02;G11C16/02;G11C16/26;H01L27/105;H01L45/00 主分类号 G11C7/00
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