| 摘要 |
An apparatus ( 1 ) for testing a memory module ( 2 ) suitable for exchanging electrical signals with a motherboard ( 10 ) contains a device ( 8 a -8 k) suitable for detecting the operating state of at least one semiconductor chip ( 26 a -26 m) of the module, which device comprises a first set of signal lines ( 8 a -8 k), a microcontroller ( 3 ) with a memory device ( 32 ) for storing the operating state, said microcontroller being electrically connected to the signal lines ( 8 a -8 k), a clock generator ( 5 ) suitable for generating an operating clock, said clock generator being electrically connected to the microcontroller ( 3 ), and a signal connection ( 13 ) suitable for communicating a signal for controlling access to the memory module ( 2 ) between the circuit board arrangement ( 10 ) and the microcontroller ( 3 ) and for communicating to the microcontroller ( 3 ) a signal for initiating a process of detecting the operating state.
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