发明名称 METHOD OF MEASURING CRITICAL ELECTRIC CURRENT VALUE OF SUPERCONDUCTING WIRE
摘要 <p>A method of measuring a critical electric current value of a superconducting wire (1) is provided with steps of measuring first to m-th (where m is an integer number of 2 or more) electric current values (I&lt;SUB&gt;1&lt;/SUB&gt;, I&lt;SUB&gt;2&lt;/SUB&gt;,..., I&lt;SUB&gt;m&lt;/SUB&gt;) and first to m-th voltage values (V&lt;SUB&gt;1&lt;/SUB&gt;, V&lt;SUB&gt;2&lt;/SUB&gt;,..., V&lt;SUB&gt;m&lt;/SUB&gt;). The first electric current value I&lt;SUB&gt;1&lt;/SUB&gt; and the first voltage value V&lt;SUB&gt;1&lt;/SUB&gt; are measured by measuring an electric current flowing through a superconducting wire (1) and a voltage generated at the superconducting wire (1) after an electric current is maintained for a predetermined period of time in a state in which the electric current flowing from a constant electric current source (6) through the superconducting wire (1) is set to a first setting value I&lt;SUB&gt;1a&lt;/SUB&gt;. A k-th electric current value I&lt;SUB&gt;k&lt;/SUB&gt; and a k-th voltage value V&lt;SUB&gt;k&lt;/SUB&gt;, (where k is an integer number to satisfy 2=k=m), are measured by measuring an electric current flowing through the superconducting wire (1) and a voltage generated at the superconducting wire (1) after an electric current is maintained for a predetermined period of time in a state in which the electric current flowing from the constant electric current source through the superconducting wire is set to a k-th setting value I&lt;SUB&gt;ka&lt;/SUB&gt; that is higher than a (k-1)-th setting current. To this end, a precise critical electric current value can be measured.</p>
申请公布号 WO2007077653(A1) 申请公布日期 2007.07.12
申请号 WO2006JP318847 申请日期 2006.09.22
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD.;UENO, EISAKU;KATO, TAKESHI;FUJIKAMI, JUN 发明人 UENO, EISAKU;KATO, TAKESHI;FUJIKAMI, JUN
分类号 G01N27/00;G01R19/00 主分类号 G01N27/00
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