发明名称 TEMPERATURE DETECTION CIRCUIT AND METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a temperature detection circuit capable of precisely detecting a temperature of an object of the temperature is detected, and to provide a method therefor. SOLUTION: The temperature detection circuit comprises a circuit 3 for generating a temperature-dependent voltage that generates a temperature-dependent voltage VR, a band-gap circuit 2 for generating a temperature-independent voltage VBG, and a comparator 4 that compares the temperature-dependent voltage VR generated in the circuit 3 with the temperature-independent voltage VBG generated in the band-gap circuit 2 and outputs a temperature-detecting signal that indicates the magnitude correlation between the voltages VR and VBG, based on a comparison result thereof. The band-gap circuit 2 includes an N-channel transistor with the source thereof being connected to input terminals of the comparator 4, for supplying a current with positive temperature characteristics, and an amplifier 41 that drives the gate of the N-channel transistor so that the source potential of the N-channel transistor becomes a fixed potential, independently of the temperature of the object. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007178342(A) 申请公布日期 2007.07.12
申请号 JP20050378886 申请日期 2005.12.28
申请人 TDK CORP 发明人 SENRIUCHI TADAO;ITSUKIDA TAKEO
分类号 G01K7/00;G01K7/01 主分类号 G01K7/00
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