| 摘要 |
PROBLEM TO BE SOLVED: To efficiently conduct analog signal conversion test, to improve the efficiency in product development, and to easily evaluate and determine the characteristics of only a D/A conversion circuit, without increasing a circuit scale, in a semiconductor integrated circuit device for combining and mounting an A/D conversion circuit and a D/A conversion circuit. SOLUTION: The semiconductor integrated circuit device is provided with: the A/D conversion circuit for converting an analog signal into a digital signal, the D/A conversion circuit for converting the digital signal into the analog signal; a connection means for connecting an output terminal of the D/A conversion circuit to an input terminal of the A/D conversion circuit; and a comparison means for comparing digital data based on the digital signal outputted from the A/D conversion circuit, when by the connection means the output terminal of the D/A conversion circuit and the input terminal of the A/D conversion terminal are made electrically continuous. COPYRIGHT: (C)2007,JPO&INPIT
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