发明名称 Semiconductor treating device
摘要 A semiconductor treating device ( 1 ) includes treating chamber ( 2 ) connected to a common transportation chamber ( 8 ) and treating a substrate (W) to be treated. A gas supply system ( 40 ) for supplying system ( 40 ) for supplying a predetermined gas to each of the treating chambers ( 2 ) is attached to each chamber. The gas supply system ( 40 ) has a primary side connection unit ( 23 ) connected to the source of the predetermined gas and has a flow rate control unit ( 13 ). The primary side connection unit ( 23 ) connected to the source of the predetermined gas and has a flow rate control unit ( 13 ). The primary side connection unit ( 23 ) is placed on the lower side of the corresponding treating chamber ( 2 ). The flow rate control unit ( 13 ) is placed on a gas line for supplying the gas from the primary side connection unit ( 23 ) to the corresponding treating chamber ( 2 ). The flow rate control unit ( 13 ) is provided such that at least a part of it is superposed on the upper side of the primary side connection unit ( 23 ).
申请公布号 US2007160447(A1) 申请公布日期 2007.07.12
申请号 US20050588851 申请日期 2005.02.04
申请人 TOKYO ELECTRON LIMITED 发明人 AMIKURA NORIHIKO;TEZUKA KAZUYUKI;MIYOSHI RISAKO
分类号 H01L21/205;H01L21/677;C23C16/455;H01L21/00;H01L21/02 主分类号 H01L21/205
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