发明名称 |
Semiconductor treating device |
摘要 |
A semiconductor treating device ( 1 ) includes treating chamber ( 2 ) connected to a common transportation chamber ( 8 ) and treating a substrate (W) to be treated. A gas supply system ( 40 ) for supplying system ( 40 ) for supplying a predetermined gas to each of the treating chambers ( 2 ) is attached to each chamber. The gas supply system ( 40 ) has a primary side connection unit ( 23 ) connected to the source of the predetermined gas and has a flow rate control unit ( 13 ). The primary side connection unit ( 23 ) connected to the source of the predetermined gas and has a flow rate control unit ( 13 ). The primary side connection unit ( 23 ) is placed on the lower side of the corresponding treating chamber ( 2 ). The flow rate control unit ( 13 ) is placed on a gas line for supplying the gas from the primary side connection unit ( 23 ) to the corresponding treating chamber ( 2 ). The flow rate control unit ( 13 ) is provided such that at least a part of it is superposed on the upper side of the primary side connection unit ( 23 ).
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申请公布号 |
US2007160447(A1) |
申请公布日期 |
2007.07.12 |
申请号 |
US20050588851 |
申请日期 |
2005.02.04 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
AMIKURA NORIHIKO;TEZUKA KAZUYUKI;MIYOSHI RISAKO |
分类号 |
H01L21/205;H01L21/677;C23C16/455;H01L21/00;H01L21/02 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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