发明名称 Random number test circuit
摘要 The random number test circuit includes a shift register which operates based on a clock and which successively stores serial random numbers generated by a random number generation element, a first random number being output from a predetermined stage of the shift register; a comparison circuit which compares the first random number with a second random number located at a distance of a first predetermined number of bits from the first random number, the second random number being generated by the random number generation element; a counter which counts a frequency of occurrence of equality or inequality between the first random number and the second random number, with respect to all bits in the serial random numbers, and a decision circuit which judges an article quality to be good if a count value in the counter indicates a frequency of occurrence equal to or less than a number determined previously by correlation.
申请公布号 US2007162806(A1) 申请公布日期 2007.07.12
申请号 US20060635590 申请日期 2006.12.08
申请人 MATSUMOTO MARI;TANAMOTO TETSUFUMI;FUJITA SHINOBU 发明人 MATSUMOTO MARI;TANAMOTO TETSUFUMI;FUJITA SHINOBU
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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