发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 <p>A semiconductor device capable of increasing a strain quantity given by a stress provided film and increasing a drive force in a MOS transistor having an elevated region; and a method of fabricating the semiconductor device. An element isolation region (102), a gate insulation film (103), a gate electrode (104), an extension (105) and a side-wall insulation film (106) are formed on a silicon substrate. Then, an elevated region (107) is formed to form a source/drain (108) and a silicide layer (109). Next, the side-wall insulation film (106) is etched to leave the interval between it and the elevated region (107), and a stress provided film (110) is buried individually.</p>
申请公布号 WO2007077748(A1) 申请公布日期 2007.07.12
申请号 WO2006JP325465 申请日期 2006.12.21
申请人 NEC CORPORATION;OKUDA, YOSHIFUMI;WAKABAYASHI, HITOSHI 发明人 OKUDA, YOSHIFUMI;WAKABAYASHI, HITOSHI
分类号 H01L29/78 主分类号 H01L29/78
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