发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
<p>A semiconductor device capable of increasing a strain quantity given by a stress provided film and increasing a drive force in a MOS transistor having an elevated region; and a method of fabricating the semiconductor device. An element isolation region (102), a gate insulation film (103), a gate electrode (104), an extension (105) and a side-wall insulation film (106) are formed on a silicon substrate. Then, an elevated region (107) is formed to form a source/drain (108) and a silicide layer (109). Next, the side-wall insulation film (106) is etched to leave the interval between it and the elevated region (107), and a stress provided film (110) is buried individually.</p> |
申请公布号 |
WO2007077748(A1) |
申请公布日期 |
2007.07.12 |
申请号 |
WO2006JP325465 |
申请日期 |
2006.12.21 |
申请人 |
NEC CORPORATION;OKUDA, YOSHIFUMI;WAKABAYASHI, HITOSHI |
发明人 |
OKUDA, YOSHIFUMI;WAKABAYASHI, HITOSHI |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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