| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of specifying a defect generation spot more precisely, while measuring current consumption from an external terminal of the semiconductor integrated circuit. SOLUTION: The semiconductor integrated circuit 1 includes an analog circuit A operated by the power supplied from a power source terminal Tp. The semiconductor integrated circuit 1 includes a control circuit 11 for switching-on/off current supply to each circuit unit U1 in a circuit unit U1 unit provided in each function of the analog circuit A in an ordinary mode time. At a test mode time for measuring the current consumption, the control circuit 11 switches-on/off current supply to each small block B11-B13 in a small block unit which is smaller than the circuit unit U1 corresponding to an input signal into a control terminal Tc. COPYRIGHT: (C)2007,JPO&INPIT
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