发明名称 Automatic layer deposition process
摘要 The atomic layer deposition process according to the invention provides the following steps for the production of homogeneous layers on a substrate. The substrate is introduced into a reaction chamber. A first precursor is introduced into the reaction chamber, which first precursor reacts on the surface of the substrate to form an intermediate product. A second precursor is introduced into the reaction chamber, which second precursor has a low sticking coefficient and reacts with part of the intermediate product to form a first product. A third precursor is introduced into the reaction chamber, which third precursor has a high sticking coefficient and reacts with the remaining part of the intermediate product to form a second product. The second precursor and its first product reduce the effective sticking coefficient of the third precursor by partially covering the surface.
申请公布号 US2007161180(A1) 申请公布日期 2007.07.12
申请号 US20060331441 申请日期 2006.01.13
申请人 INFINEON TECHNOLOGIES AG 发明人 ERBEN ELKE;JAKSCHIK STEFAN;KERSCH ALFRED;LINK ANGELA;SUNDQVIST JONAS
分类号 H01L21/8242 主分类号 H01L21/8242
代理机构 代理人
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