发明名称 SEMICONDUCTOR IMAGING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a small and highly reliable semiconductor imaging device capable of downsizing and miniaturizing the device with the use of the common structure of the signal voltage reading part with four photoelectric converting parts adjacent in columns, and suppressing a vaiation in signal voltage to elaborately reading the signal by arranging each photoelectric converting part as equally spaced as possible. SOLUTION: The semiconductor imaging device comprises the four PDs (PD1 to PD4) aligning in a row direction that have the signal voltage reading part in common. Each component, PD1/FD1, TG-Tr1,2/PD2/SF-Tr, SL-Tr/PD3/FD2, TG-Tr3,4/PD4/RS-Tr is arranged in this order. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007180336(A) 申请公布日期 2007.07.12
申请号 JP20050378115 申请日期 2005.12.28
申请人 FUJITSU LTD 发明人 OKAWA SHIGEMI
分类号 H01L27/146 主分类号 H01L27/146
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