发明名称 |
APPARATUS FOR TESTING A LIGHT RECEIVING ELEMENT AND METHOD OF THE SAME |
摘要 |
An apparatus for testing a light receiving element and a method thereof is provided to accurately test an image sensor and save a correction time for a test apparatus by keeping a regular characteristic of light from an illuminator. An apparatus(100) for testing a light receiving element includes a probe card(110), an illuminator(120), a driving part(130), and a controller(140). The probe card measures a light characteristic of an image sensor. The illuminator is installed having a gap from the illuminator and irradiates light to the probe card. The driving part outputs a driving signal to the illuminator for controlling light quantity from the illuminator. The controller controls a test of the probe card. The probe card has a probe hole. At least one reference light receiving element is arranged near the probe hole.
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申请公布号 |
KR20070074429(A) |
申请公布日期 |
2007.07.12 |
申请号 |
KR20060022314 |
申请日期 |
2006.03.09 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JONG MOON;LEE, JUN TAEK;KIM, HARK MOO |
分类号 |
G01J1/00 |
主分类号 |
G01J1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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