发明名称 APPARATUS FOR TESTING A LIGHT RECEIVING ELEMENT AND METHOD OF THE SAME
摘要 An apparatus for testing a light receiving element and a method thereof is provided to accurately test an image sensor and save a correction time for a test apparatus by keeping a regular characteristic of light from an illuminator. An apparatus(100) for testing a light receiving element includes a probe card(110), an illuminator(120), a driving part(130), and a controller(140). The probe card measures a light characteristic of an image sensor. The illuminator is installed having a gap from the illuminator and irradiates light to the probe card. The driving part outputs a driving signal to the illuminator for controlling light quantity from the illuminator. The controller controls a test of the probe card. The probe card has a probe hole. At least one reference light receiving element is arranged near the probe hole.
申请公布号 KR20070074429(A) 申请公布日期 2007.07.12
申请号 KR20060022314 申请日期 2006.03.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JONG MOON;LEE, JUN TAEK;KIM, HARK MOO
分类号 G01J1/00 主分类号 G01J1/00
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