发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME |
摘要 |
PROBLEM TO BE SOLVED: To adjust threshold voltage of transistors of the same conductivity in a semiconductor device using an FUSI (Fully Silicided) gate electrode as a gate electrode. SOLUTION: A semiconductor device comprises: a first transistor 115A(or 115B) of a first conductivity having a first gate electrode 115a(or 115b) of a metallic silicide film formed on a substrate 100 with a first gate insulating film 103A disposed therebetween, and a second transistor 116A(or 116B) of the first conductivity having a second gate electrode 116a(or 116b) of a metallic silicide film formed on the substrate 100 with a second gate insulating film 103A disposed therebetween. The first and second gate electrodes 115a(or 115b) and 116a(or 116b) have mutually different silicide composition ratios. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007180354(A) |
申请公布日期 |
2007.07.12 |
申请号 |
JP20050378567 |
申请日期 |
2005.12.28 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
OKAZAKI GEN;SATO YOSHIHIRO;KOTANI NAOKI |
分类号 |
H01L21/8234;H01L21/28;H01L21/8238;H01L27/088;H01L27/092;H01L29/423;H01L29/49 |
主分类号 |
H01L21/8234 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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