发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
摘要 PROBLEM TO BE SOLVED: To adjust threshold voltage of transistors of the same conductivity in a semiconductor device using an FUSI (Fully Silicided) gate electrode as a gate electrode. SOLUTION: A semiconductor device comprises: a first transistor 115A(or 115B) of a first conductivity having a first gate electrode 115a(or 115b) of a metallic silicide film formed on a substrate 100 with a first gate insulating film 103A disposed therebetween, and a second transistor 116A(or 116B) of the first conductivity having a second gate electrode 116a(or 116b) of a metallic silicide film formed on the substrate 100 with a second gate insulating film 103A disposed therebetween. The first and second gate electrodes 115a(or 115b) and 116a(or 116b) have mutually different silicide composition ratios. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007180354(A) 申请公布日期 2007.07.12
申请号 JP20050378567 申请日期 2005.12.28
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OKAZAKI GEN;SATO YOSHIHIRO;KOTANI NAOKI
分类号 H01L21/8234;H01L21/28;H01L21/8238;H01L27/088;H01L27/092;H01L29/423;H01L29/49 主分类号 H01L21/8234
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