发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent adhesion of products of etching upon forming contact hole on a ferroelectric capacitor to the surface of a wafer. SOLUTION: In order to form the contact hole 4 to the upper electrode or the lower electrode (electrode 1) of the ferroelectric capacitor, a resist mask 3 having a predetermined film thickness is formed and the contact hole 4 is formed by etching, so that the opening 3b of resist mask 3 after forming the contact hole 4 becomes a tapered configuration by the expansion of the diameter thereof by etching, and the film thickness of a vertical configuration part becomes substantially zero. According to this method, the products of etching 5, produced by the over etching of the material of electrode or the like, are adhered to the side wall of the opening 3b of the resist mask 3, which becomes the tapered configuration, while the etching is continued still whereby the products of etching hardly remain when the etching is finished. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007180311(A) 申请公布日期 2007.07.12
申请号 JP20050377855 申请日期 2005.12.28
申请人 FUJITSU LTD 发明人 KIUCHI KENJI;KOMURO GENICHI
分类号 H01L21/8246;H01L27/105 主分类号 H01L21/8246
代理机构 代理人
主权项
地址