发明名称 PROBER OPERATION MANAGEMENT SYSTEM
摘要 PROBLEM TO BE SOLVED: To improve an inspection accuracy and an entire utilization of probers 1 by solving a lighting failure. SOLUTION: A prober operation management system comprises: an input means such as a touch panel for inputting the ID of a probe block 17 or a probe unit 4 for a prober 1; a searching means for searching a database for contact frequency information corresponding to the ID; a determining means for determining whether a contact frequency exceeds a predetermined value when the contact frequency information corresponding to the ID exists in the database; an alarming means for alarming on a display screen or the like when the contact frequency exceeds the predetermined value; an inspecting means for performing inspecting operation by bringing a probe needle of the probe block 17 into contact with a liquid crystal panel P; a counting means for counting a contact frequency every time the probe needle of the probe block 17 is contacted with the liquid crystal panel P; and an adding means for adding the counted contact frequency to the existing contact frequency information. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007180350(A) 申请公布日期 2007.07.12
申请号 JP20050378471 申请日期 2005.12.28
申请人 MICRONICS JAPAN CO LTD 发明人 KOSAKA YUTAKA;SATO KAZUO;IMOTO SHINICHIRO
分类号 H01L21/02 主分类号 H01L21/02
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