发明名称 |
Process monitor for laser and plasma materials processing of materials |
摘要 |
A method for monitoring the processing of a workpiece includes directing an incident laser beam onto the workpiece and measuring a signal emitted from the workpiece. At least two signals are generated by a detector based upon the emitted signal. A workpiece processing quality is determined based upon the ratio of the two output signals and a magnitude of one of the two outputs.
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申请公布号 |
US2007158319(A1) |
申请公布日期 |
2007.07.12 |
申请号 |
US20070653008 |
申请日期 |
2007.01.12 |
申请人 |
HYPERTHERM, INC. |
发明人 |
CONNALLY WILLIAM J.;WOODS KENNETH J. |
分类号 |
B23K26/03;B23K10/00 |
主分类号 |
B23K26/03 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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